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theory
Quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) images often requires comparison of experimental data with simulations of beam propagation through and images of hypothesized structures. This, in turn, necessitates a thorough understanding of the phenomena that govern interactions of the STEM probe with a sample. Through first-principles simulation of the interaction between electrons in STEM probes with atoms in a variety of samples, we gain deeper insight into the root causes of observed phenomena. Results from this work can then be used to formulate hypotheses for new ways of characterizing specimens.
Figure: 2D beam intensity depth profiles of a simulated STEM probe propagating in vacuum, and down the [001] zone axis of crystals of diamond C, Si, and α-Fe, showing the strong effects of electron channeling in different media. The solid circles mark positions of atomic columns. Figure reproduced from [1]
Recommended Reading
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"Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM)"
R. J. Wu, A. Mittal, M. L. Odlyzko, K. A. Mkhoyan
- Microsc. Microanal. 23, 794 (2017)
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