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Electron Microscopes
Transmission Electron Microscopes
FEI Titan G2 60-300 X-FEG (Scanning) TEM
Monochromated and Aberration-Corrected
  • Operational at 60, 80, 200, and 300 kV;
  • Point-to-point resolution of 0.20 nm with information limit of 0.08 nm;
  • ADF-STEM with resolution of 0.063 nm at 300 keV;
  • ChemiSTEM EDX spectrometer;
  • Gatan Enfinium EEL spectrometer with 0.17 eV resolution;
  • Gatan Ultra1000XP 2k x 2k CCD;
ThermoFisher Talos (coming soon)
  • Operational at 60, 100, 200 and 300 kV;
  • Point-point resolution of 0.20 nm with information limit of 0.14 nm;
  • ADF-STEM with resolution of 0.19 nm;
  • EDAX rTEM EDX spectrometer;
  • Gatan Enfina EEL spectrometer;
  • Gatan UltraScan 2k x 2k CCD;
FEI Tecnai G2 F30 Cryo (Scanning) TEM
  • Operational at 100, 200 and 300 kV;
  • Point-point resolution of 0.24 nm with information limit of 0.15 nm;
  • ADF-STEM with resolution of 0.24 nm;
  • Gatan UltraScan 4k x 4k CCD;
  • Gatan GIF 2002 energy filter and EEL spectrometer;
  • Gatan 692 tv-rate CCD positioned behind GIF;
FEI Tecnai T12 TEM
  • Operational at 120 kV;
  • Point-point resolution of 0.34 nm;
  • Gatan MSC794 1k x 1k CCD;
  • Gatan 692 tv-rate CCD;
  • Oxford Inca EDX spectrometer.
TEM Holders
  • Low-background single- and double-tilt, tilt-rotate;
  • Single- and double-tilt heating;
  • Protochips Poseidon Select Liquid Cell;
  • Hysitron PI95 PicoIndenter;
  • Cryo and tomography holders;
  • Protochips Fusion Select Double-tilt Heating;
Scanning Electron Microscopes
JEOL 6500 FEG SEM
  • Accelerating voltage from 0.5 to 30 kV;
  • Secondary electron imaging with resolution of 1.5 nm;
  • Centaurus backscatter detector;
  • Thermo-Noran Vantage EDX system;
  • Gatan (Oxford) MonoCL 2 system;
  • HKL EBSD system;
  • Samples up to 50x125x125 mm in size.
FEI Helios NanoLab G4 FIB/SEM Dual-Beam
  • Fastest and easiest preparation of site-specific, ultra-thin high-resolution S/TEM specimens for a wide range of materials;
  • Final polishing with very low energy ions, enabling the creation of ultra-thin TEM lamella with sub-nm damage layers;
  • FIB milling resolution of 10 nm;
  • SEM imaging with resolution of 0.6 nm;
  • Gallium ion beam & electron dual-beam setup.
Hitachi S-900 (Cryo) Cold FEG SEM
  • Accelerating voltage from 0.5 to 30 kV;
  • Secondary e- imaging with resolution of 0.8 nm at 30 kV and 3 nm at 1 kV;
  • In-lens design allows samples up to 5x10x0.5 mm in size.

Specimen Preparation

Fischione 1010 Ion Mill
  • Fully programmable and easy to use;
  • Adjustable rocking angle;
  • Variable energy milling;
  • 0 to 45 degrees milling angle range;
  • LN2 specimen cooling.
Fischione 1070 "NanoClean" plasma cleaner
  • Fully programmable gas flow, power, and time;
  • Load-locked for fast holder insertion and removable;
  • Large-sample access door for cleaning of large samples;
Allied MultiPrep Polishing systems
  • Two MultiPrep systems in Mkhoyan Lab and one in CharFac;
  • Utilized primarily for preparation of wedge specimens;
  • Multiple polishing pads and lubricants available;



Copyright 2017 Mkhoyan Lab
University of Minnesota
 151 Amundson Hall, 421 Washington Ave. S.E.
Minneapolis, MN 55455 USA